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dc.contributor.authorKjølerbakken, Kai Morgan
dc.contributor.authorMiloch, Wojciech Jacek
dc.contributor.authorMartinsen, Ørjan Grøttem
dc.contributor.authorPabst, Oliver
dc.contributor.authorRøed, Ketil
dc.date.accessioned2022-11-08T12:10:39Z
dc.date.available2022-11-08T12:10:39Z
dc.date.created2022-04-28T13:11:21Z
dc.date.issued2022
dc.identifier.citationIEEE Transactions on Plasma Science. 2022, 50 (5), 1237-1245.en_US
dc.identifier.issn0093-3813
dc.identifier.urihttps://hdl.handle.net/11250/3030638
dc.description.abstractWe present a numerical study disclosing non-linear effects and hysteresis loops for a swept bias Langmuir probe. A full kinetic particle in cell (PIC) model has been used to study the temporal sheath effects and the probe current. Langmuir "close to steady state" condition is required to characterize the plasma. However, during operations above frequencies normally used, capacitive and non-linear resistive effects are being unveiled. We demonstrate how ion and electron density and temperature change properties of the probe-plasma system. We also show that a swept Langmuir probe exhibits essential properties described as the "fingerprint of memristors" and how a Langmuir probe can be identified as a transversal memristor. Understanding non-linear processes might enable new ways to operate Langmuir probes with higher sampling rates and better accuracy.en_US
dc.language.isoengen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleNumerical Study of Non-Linear Effects for a Swept Bias Langmuir Probeen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.source.pagenumber1237-1245en_US
dc.source.volume50en_US
dc.source.journalIEEE Transactions on Plasma Scienceen_US
dc.source.issue5en_US
dc.identifier.doi10.1109/TPS.2022.3164220
dc.identifier.cristin2019809
dc.relation.projectEC/H2020/866357en_US
dc.relation.projectSigma2: NN9761Ken_US
dc.relation.projectNorges forskningsråd: 275653en_US
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal